Device Characterization Module — DCM

The Modu-Lab DCM allows for the precision measurement of resistance, diode function, transistor characterization, and sheet resistivity.   The probe station features 3 micro-manipulators, a video microscope, and fine platform height adjustment.  All components are mounted on a stainless steel topped table with castors for easy mobility.

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Finished Device under test on Modu-Lab DCM

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Device Substrate in test on DCM Probe Station

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Transistor Curves of a Modu-Lab device

 

 

 

 

 

 

 

 

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