Device Characterization Module — DCM
The Modu-Lab DCM allows for the precision measurement of resistance, diode function, transistor characterization, and sheet resistivity. The probe station features 3 micro-manipulators, a video microscope, and fine platform height adjustment. All components are mounted on a stainless steel topped table with castors for easy mobility.
Finished Device under test on Modu-Lab DCM
Device Substrate in test on DCM Probe Station
Transistor Curves of a Modu-Lab device